Gaya APA
Zhou, Haiping. (2000).
Comparison of Backcalculated and Laboratory Measured Moduli on AC and Granular Base Layer Materials .
:
ASTM.
Gaya Chicago
Zhou, Haiping.
Comparison of Backcalculated and Laboratory Measured Moduli on AC and Granular Base Layer Materials.
:
ASTM,
2000.
Computer Software.
Gaya MLA
Zhou, Haiping.
Comparison of Backcalculated and Laboratory Measured Moduli on AC and Granular Base Layer Materials.
:
ASTM,
2000.
Computer Software.
Gaya Turabian
Zhou, Haiping.
Comparison of Backcalculated and Laboratory Measured Moduli on AC and Granular Base Layer Materials.
:
ASTM,
2000.
Computer Software.